Quantification by X-rays diffraction

The freeware Fullprof allow to quantify crystallised
components displayed on a X-rays diffraction spectrum.

A diffraction spectrum can be obtained with X-rays diffract meter on a powder sample, elaborated before (steels, ceramics, crystals...).

The nature of the different crystallised components present in the sample is detectable with a crystalline phases research software like Diffract AT.

The Fullprof software allow, after a right configuration, to effectue a Rietveld affinement with the measured spectrum and to calculate very precises informations about the analysed sample. (cell parameters, quantitative composition of cristalised phases....)

The Fullprof software allows, after a right configuration, to realise a Rietveld calculation with the measured spectrum and to calculate very precise information about the analysed sample (cell parameters, quantitative composition of crystallised phases....).